Fundraising September 15, 2024 – October 1, 2024
About fundraising
books search
books
Fundraising:
22.6% raised
Log In
Log In
to access more features
personal recommendations
Telegram Bot
download history
send to Email or Kindle
manage booklists
save to favorites
Personal
Book Requests
Explore
Z-Recommend
Booklists
Most Popular
Categories
Contribution
Donate
Uploads
Litera Library
Donate paper books
Add paper books
Search paper books
Open LITERA Point
Terms search
Main
Terms search
search
1
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling
Springer India
Souvik Mahapatra (eds.)
stress
nbti
δvt
devices
gate
measured
hkmg
degradation
shown
mosfets
evolution
pbti
generation
recovery
δvit
dependence
traps
bti
insulator
measurements
δnit
mahapatra
tstr
eox
chap
electron
exponent
trapping
delay
dciv
shows
reliability
device
discussed
method
measurement
bias
msm
figure
obtained
physics
pdc
temperature
δvht
symposium
impact
parameters
proceedings
activation
fixed
Year:
2016
Language:
english
File:
PDF, 20.69 MB
Your tags:
0
/
0
english, 2016
1
Follow
this link
or find "@BotFather" bot on Telegram
2
Send /newbot command
3
Specify a name for your chatbot
4
Choose a username for the bot
5
Copy an entire last message from BotFather and paste it here
×
×